Semisupervised Classification of Anomalies Signatures in Electrical Wafer Sorting (EWS) Maps.
Luigi Claudio ViagrandeFilippo L. M. MilottaPaola GiuffrèGiuseppe BrunoDaniele VinciguerraGiovanni GalloPublished in: VISIGRAPP (5: VISAPP) (2020)
Keyphrases
- pattern recognition
- automatic classification
- classification accuracy
- incremental learning
- support vector machine
- machine learning
- classification method
- classification algorithm
- pattern classification
- multi relational data
- classification systems
- decision rules
- model selection
- image classification
- feature vectors
- support vector
- cost sensitive
- neural network
- power grid
- class conditional
- signature scheme
- feature selection
- integrated circuit
- classification scheme
- face recognition
- text classification
- classification rules
- machine learning methods
- multi class
- semi supervised
- benchmark datasets