An easy-to-use mismatch model for the MOS transistor.
Jeroen A. CroonMaarten RosmeulenStefaan DecoutereWilly SansenHerman E. MaesPublished in: IEEE J. Solid State Circuits (2002)
Keyphrases
- mathematical model
- formal model
- genetic algorithm
- probabilistic model
- information retrieval
- network model
- statistical model
- computational model
- theoretical analysis
- objective function
- e learning
- high speed
- high level
- theoretical framework
- web services
- hierarchical structure
- search engine
- object model
- machine learning