Low temperature endurance failures on flash memory.
Stephen K. Heinrich-BarnaClyde DunnDoug VerretPublished in: ISQED (2017)
Keyphrases
- flash memory
- garbage collection
- file system
- solid state
- random access
- buffer management
- embedded systems
- main memory
- disk drives
- b tree
- database systems
- secondary storage
- data storage
- storage management
- storage systems
- hand held devices
- small size
- low cost
- storage devices
- failure rate
- memory management
- data sets
- mobile phone
- nearest neighbor
- neural network
- real time