Login / Signup
Measurement results of within-die variations on a 90nm LUT array for speed and yield enhancement of reconfigurable devices.
Kazuya Katsuki
Manabu Kotani
Kazutoshi Kobayashi
Hidetoshi Onodera
Published in:
ASP-DAC (2006)
Keyphrases
</>
image enhancement
mobile devices
low cost
high speed
general purpose
embedded systems
data sets
hardware implementation
lookup table
dynamic reconfiguration
systolic array
reconfigurable architecture