A Comprehensive Model for Write Disturbance in Resistive Memory Composed of Cross-Point Array.

Yoshiaki Asao Fumio Horiguchi

Published in: IEICE Trans. Electron. (2017)

Keyphrases

statistical model
probability distribution
computational model
machine learning
information retrieval
decision trees
case study
objective function
probabilistic model
experimental data
neural network model
formal model
data sets
information systems
artificial neural networks
conceptual model