Login / Signup

Correction to "Analytical Thermal Model for Self-Heating in Advanced FinFET Devices With Implications for Design and Reliability".

Chuan XuSeshadri K. KolluriKazuhiko EndoKaustav Banerjee
Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2020)
Keyphrases