On machine learning analysis of atomic force microscopy images for image classification, sample surface recognition.
Igor SokolovPublished in: CoRR (2024)
Keyphrases
- image classification
- image recognition
- machine learning
- image analysis
- image features
- three dimensional
- object recognition
- feature extraction
- image data
- pattern recognition
- image retrieval
- image representation
- class specific
- input image
- image database
- edge detection
- bag of words
- sample images
- three dimensional objects
- test images
- image matching
- computer vision
- visual words
- action recognition
- image registration
- image processing
- handwritten digits