A High Reliable SRAM-Based PUF With Enhanced Challenge-Response Space.

Lu Lu Tony Tae-Hyoung Kim

Published in: IEEE Trans. Circuits Syst. II Express Briefs (2022)

Keyphrases

power consumption
low dimensional
space time
high reliability
three dimensional
video sequences
electronic devices
space requirements
low power
significantly enhanced
genetic algorithm
high efficiency
vector space
cost effective
search space
high dimensional
multiscale