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A Machine Learning Approach to Predict Radiation Effects in Microelectronic Components.

Fernando MorillaJesús VegaSebastián Dormido-CantoAmor Romero-MaestreJosé de-Martín-HernándezYolanda MorillaPedro Martín-HolgadoManuel Domínguez
Published in: Sensors (2024)
Keyphrases
  • x ray
  • database
  • real world
  • decision trees
  • image registration
  • infrared
  • failure modes
  • real time
  • data sets
  • databases
  • multiscale
  • multiresolution
  • positive effects