Elliptical modeling and pattern analysis for perturbation models and classification.
Shan SuthaharanWeining ShenPublished in: Int. J. Data Sci. Anal. (2019)
Keyphrases
- pattern analysis
- pattern recognition
- pattern classification
- classification models
- modeling framework
- computational intelligence
- image classification
- machine learning
- mathematical modeling
- statistical modeling
- data analysis
- decision rules
- machine learning methods
- statistical models
- neural network
- model selection
- image analysis
- feature vectors
- support vector machine
- probabilistic model
- classification systems
- feature extraction
- modeling method
- face recognition
- stochastic models
- computer vision
- models built
- hybrid models