Physics-based EM models in support of through-wall microwave imaging.
Peter B. WeichmanPublished in: CAMSAP (2011)
Keyphrases
- probabilistic model
- statistical models
- decision trees
- image formation
- prior knowledge
- complex systems
- model selection
- maximum likelihood
- model fitting
- mathematical models
- statistical model
- parameter estimation
- decision support
- neural network
- high resolution
- image analysis
- bayesian networks
- image sequences
- three dimensional
- information retrieval