A Fast Testing Method for Sequential Circuits at the State Trasition Level.
Wei-Lun WangJhing-Fa WangKuen-Jong LeePublished in: ITC (1992)
Keyphrases
- detection method
- similarity measure
- preprocessing
- probabilistic model
- computational cost
- clustering method
- computationally efficient
- high accuracy
- pixel level
- high precision
- classification method
- synthetic data
- high speed
- experimental evaluation
- pairwise
- computational complexity
- dynamic programming
- hidden markov models
- cost function
- significant improvement
- higher level
- artificial neural networks
- theoretical analysis
- support vector machine svm
- feature space
- support vector
- decision trees
- evaluation method
- feature selection