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Performance Trade-Off Scenarios for GAA Nanosheet FETs Considering Inner-spacers and Epi-induced Stress: Understanding & Mitigating Process Risks.

Amita RawatKrishna K. BhuwalkaPhilippe MatagneBjorn VermeerschHao WuGeert HellingsJulien RyckaertChangze Liu
Published in: ESSDERC (2021)
Keyphrases
  • trade off
  • risk management
  • real world
  • data structure
  • databases
  • learning algorithm
  • artificial neural networks