Automatic Failure-Analysis System for High-Density DRAM.

Sangchul Oh Jae-Ho Kim Ho-Jeong Choi Si-Don Choi Ki Tae Park Jong-Woo Park Wha-Joon Lee

Published in: ITC (1994)

Keyphrases

high density
low density
data analysis
close proximity
statistical analysis
high bandwidth
data center
automatic analysis
data sets
structural analysis
image analysis
cost effective
thin film
mathematical analysis
magnetic tape