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An Efficient Scan Tree Design for Compact Test Pattern Set.

Shibaji BanerjeeDipanwita Roy ChowdhuryBhargab B. Bhattacharya
Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2007)
Keyphrases
  • knowledge based systems
  • building blocks
  • engineering design
  • design process
  • case study
  • face recognition
  • data structure
  • pairwise
  • principal component analysis
  • design principles
  • experimental design
  • binary tree