Advanced Multiprobe Dual-Polarized Arch System for Microwave Reflectance Measurement.

Haidong Chen Zhaoling He Jieyao Yang Weijun Zhong Haitian Zhou Mengzhu Yan Yi Wang Jun Zhang Weijie Lin Linbo Chen Ye Han Wenquan Che Jian Hu Quan Xue

Published in: IEEE Trans. Instrum. Meas. (2024)

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