Advanced Multiprobe Dual-Polarized Arch System for Microwave Reflectance Measurement.
Haidong ChenZhaoling HeJieyao YangWeijun ZhongHaitian ZhouMengzhu YanYi WangJun ZhangWeijie LinLinbo ChenYe HanWenquan CheJian HuQuan XuePublished in: IEEE Trans. Instrum. Meas. (2024)