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Library Characterization of Arithmetic Circuits for Reliability-Aware Designs in SRAM-Based FPGAs.
Akin Gokalan
Suleyman Tosun
Deniz Dal
Published in:
J. Electron. Test. (2020)
Keyphrases
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random access memory
power reduction
high speed
power consumption
low power
delay insensitive
nm technology
power dissipation
cmos technology
low voltage
reliability analysis
design considerations
data transmission
analog circuits
highly reliable
logic synthesis
analog vlsi
source code