Semiconductor Device Parameter Extraction Based on I-V Measurements and Simulation.
Dominik KasprowiczPublished in: MIXDES (2019)
Keyphrases
- semiconductor devices
- data sets
- simulation models
- automatic extraction
- information extraction
- knowledge extraction
- database
- measured data
- artificial intelligence
- mathematical models
- parameter values
- simulation study
- simulation model
- parameter settings
- steady state
- learning environment
- virtual environment
- simulation environment
- mathematical analysis
- neural network
- sensor networks
- design parameters
- automatically extracting
- measurement data
- search engine