Optimizing LSTM and Bi-LSTM models for crop yield prediction and comparison of their performance with traditional machine learning techniques.
V. Kiran KumarK. V. RameshV. RakeshPublished in: Appl. Intell. (2023)
Keyphrases
- probabilistic model
- prediction accuracy
- prediction model
- machine learning
- machine learning approaches
- machine learning algorithms
- machine learning methods
- recurrent neural networks
- predictive modeling
- parametric models
- process model
- models built
- predictive model
- statistical methods
- data sets
- business intelligence
- statistical analysis
- image sequences
- information systems
- databases