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Algorithms for Metric Learning via Contrastive Embeddings.

Diego IharaNeshat MohammadiAnastasios Sidiropoulos
Published in: SoCG (2019)
Keyphrases
  • metric learning
  • distance metric
  • machine learning and pattern recognition
  • learning algorithm
  • multi class
  • dimensionality reduction
  • image classification
  • vector space
  • multi task