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Analytical reliability estimation of SRAM-based FPGA designs against single-bit and multiple-cell upsets.

Reza RamezaniJuan Antonio ClementeFrancisco J. Franco
Published in: Reliab. Eng. Syst. Saf. (2020)
Keyphrases
  • random access memory
  • high speed
  • power consumption
  • image processing
  • real time
  • data sets
  • neural network
  • signal processing
  • hardware implementation
  • data transmission
  • microscopy images