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Simulation-based generation of posynomial performance models for the sizing of analog integrated circuits.

Walter DaemsGeorges G. E. GielenWilly M. C. Sansen
Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2003)
Keyphrases
  • integrated circuit
  • genetic algorithm
  • statistical models
  • probabilistic model
  • database
  • learning environment
  • artificial neural networks
  • model selection
  • complex systems
  • process model
  • electron beam