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Simulation-based generation of posynomial performance models for the sizing of analog integrated circuits.
Walter Daems
Georges G. E. Gielen
Willy M. C. Sansen
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2003)
Keyphrases
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integrated circuit
genetic algorithm
statistical models
probabilistic model
database
learning environment
artificial neural networks
model selection
complex systems
process model
electron beam