BIST to Detect and Characterize Transient and Parametric Failures.

Alodeep Sanyal Syed M. Alam Sandip Kundu

Published in: IEEE Des. Test Comput. (2010)

Keyphrases

detection method
automatic detection
detection algorithm
steady state
decision making
wide range
data sets
machine learning
genetic algorithm
expert systems
information technology
mobile robot
parametric models