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A deep sub-micron timing measurement circuit using a single-stage Vernier delay line.
Antonio H. Chan
Gordon W. Roberts
Published in:
CICC (2002)
Keyphrases
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single stage
multistage
inventory systems
cmos technology
serial inventory systems
lead time
stochastic optimization
max min
lost sales
network flow
transportation problem
electron beam
optimal policy
special case
setup cost