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Test Strategies for BIST at the Algorithmic and Register-Transfer Levels.

Kelly A. OckunzziChristos A. Papachristou
Published in: DAC (2001)
Keyphrases
  • built in self test
  • real world
  • three dimensional
  • real time
  • image processing
  • multiresolution
  • probabilistic model
  • levels of abstraction
  • optimization strategies