Impact of Lightly Doped Drain on Hot Carrier Degradation Variability in N-FETs and SRAM Cells.

Qiao Teng Yongyu Wu Junzhe Kang Kai Xu Dawei Gao

Published in: IRPS (2024)

Keyphrases

power consumption
low power
data transmission
high impact
artificial intelligence
software development
communication networks
factors that influence
cellular automaton