Deep-learning-based prediction of nanoparticle phase transitions during in situ transmission electron microscopy.
Wenkai FuSteven R. SpurgeonChongmin WangYuyan ShaoWei WangAmra PelesPublished in: CoRR (2022)
Keyphrases
- deep learning
- phase transition
- transmission electron microscopy
- random constraint satisfaction problems
- constraint satisfaction
- x ray
- unsupervised learning
- machine learning
- satisfiability problem
- unsupervised feature learning
- randomly generated
- np complete
- random instances
- cellular automata
- weakly supervised
- sat problem
- high quality
- constraint satisfaction problems
- image processing