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Erratum: The impact of trapping centers on AlGaN/GaN resonant tunneling diode [IEICE Electronics Express Vol 10 (2013) No 19 pp 20130588].
Haoran Chen
Lin-An Yang
Xiaoxian Liu
Zhangming Zhu
Jun Luo
Yue Hao
Published in:
IEICE Electron. Express (2013)
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