Measurement-based equivalent circuit model for ferrite beads.

Mikko Hulkkonen Timo Veijola Antti Kallio Mikael Andersson Martti Valtonen

Published in: ECCTD (2009)

Keyphrases

computational model
high level
probabilistic model
mathematical model
multiscale
image processing
objective function
pattern recognition
np hard
probability distribution
experimental data
measurement model