A New Logic Topology-Based Scan Chain Stitching for Test-Power Reduction.

Sangjun Lee Kyunghwan Cho Sungki Choi Sungho Kang

Published in: IEEE Trans. Circuits Syst. (2020)

Keyphrases

power reduction
power consumption
low power
power saving
real time
low cost
image processing
cloud computing
image restoration
scheduling algorithm