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A New Logic Topology-Based Scan Chain Stitching for Test-Power Reduction.
Sangjun Lee
Kyunghwan Cho
Sungki Choi
Sungho Kang
Published in:
IEEE Trans. Circuits Syst. (2020)
Keyphrases
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power reduction
power consumption
low power
power saving
real time
low cost
image processing
cloud computing
image restoration
scheduling algorithm