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A New Technique for Runtime Leakage Reduction and Its Sensitivity and Parametric Yield Analysis Under Effective Channel-Length Variation.

Sudip RoyAjit Pal
Published in: J. Low Power Electron. (2010)
Keyphrases
  • neural network
  • quantitative analysis
  • mathematical analysis
  • decision trees
  • similarity measure
  • image analysis
  • sensitivity analysis