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Multi-Step Stress Test for Yield Improvement of 16Mbit EPROMs with Redundancy Scheme.

J. MiyamotoN. OhtsukaK. ImamiyaN. TomitaY. Iyama
Published in: ITC (1991)
Keyphrases
  • multi step
  • lower bounding
  • knn
  • semi supervised
  • single step
  • machine learning
  • optimal solution
  • feature space
  • np hard
  • test cases
  • multiple description coding