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Multi-Step Stress Test for Yield Improvement of 16Mbit EPROMs with Redundancy Scheme.
J. Miyamoto
N. Ohtsuka
K. Imamiya
N. Tomita
Y. Iyama
Published in:
ITC (1991)
Keyphrases
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multi step
lower bounding
knn
semi supervised
single step
machine learning
optimal solution
feature space
np hard
test cases
multiple description coding