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Reliability Analysis for Flexible Electronics: Case Study of Integrated a-Si: H TFT Scan Driver.

Tsung-Ching HuangHuai-Yuan TsengChen-Pang KungKwang-Ting Cheng
Published in: DAC (2007)
Keyphrases
  • reliability analysis
  • case study
  • neural network
  • data sources
  • management system
  • genetic algorithm
  • artificial intelligence
  • thin film transistor