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Automatic Defect Classification Using Frequency and Spatial Features in a Boosting Scheme.

Hong Il KimSang Hwa LeeNam Ik Cho
Published in: IEEE Signal Process. Lett. (2009)
Keyphrases
  • spatial features
  • defect classification
  • spatial information
  • spatial proximity
  • spatial relationships
  • pattern discovery
  • spatial objects
  • feature selection
  • machine learning
  • geometric properties
  • feature space
  • knn