Login / Signup

Digitally-Assisted Analog/RF Testing for Mixed-Signal SoCs.

Hsiu-Ming (Sherman) ChangMin-Sheng (Mitchell) LinKwang-Ting (Tim) Cheng
Published in: ATS (2008)
Keyphrases
  • mixed signal
  • low power
  • multi channel
  • vlsi circuits
  • digital circuits
  • high speed
  • power consumption
  • low cost
  • cmos technology
  • relevance feedback
  • radio frequency
  • single chip
  • query language