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Bounded exhaustive test-input generation on GPUs.

Ahmet ÇelikSreepathi PaiSarfraz KhurshidMilos Gligoric
Published in: Proc. ACM Program. Lang. (2017)
Keyphrases
  • general purpose
  • neural network
  • computer vision
  • input data
  • test data
  • parallel processing
  • user input
  • database
  • databases
  • learning algorithm
  • artificial intelligence
  • case study