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Evaluation of interconnect fabrics for an embedded MPSoC in 28 nm FD-SOI.

Gregor SieversJohannes AxNils KuczaMartin FlasskampThorsten JungeblutWayne KellyMario PorrmannUlrich Rückert
Published in: ISCAS (2015)
Keyphrases
  • embedded systems
  • high speed
  • evaluation metrics
  • gold standard
  • evaluation process
  • databases
  • infrared
  • fault tolerant
  • evaluation method
  • evaluation criteria