Functional-Like Transition Delay Fault Test-Pattern Generation using a Bayesian-Based Circuit Model.
Ching-Yuan ChenChing-Hong ChengJiun-Lang HuangKrishnendu ChakrabartyPublished in: ETS (2020)
Keyphrases
- probabilistic model
- statistical model
- high level
- formal model
- bayesian networks
- cost function
- bayesian inference
- theoretical framework
- transition model
- real time
- bayesian model
- simulation model
- bayesian framework
- experimental data
- energy function
- computational model
- theoretical analysis
- maximum likelihood
- level set
- graphical models
- management system
- probability distribution