Login / Signup
Functional-Like Transition Delay Fault Test-Pattern Generation using a Bayesian-Based Circuit Model.
Ching-Yuan Chen
Ching-Hong Cheng
Jiun-Lang Huang
Krishnendu Chakrabarty
Published in:
ETS (2020)
Keyphrases
</>
probabilistic model
statistical model
high level
formal model
bayesian networks
cost function
bayesian inference
theoretical framework
transition model
real time
bayesian model
simulation model
bayesian framework
experimental data
energy function
computational model
theoretical analysis
maximum likelihood
level set
graphical models
management system
probability distribution