Improvement of TCAD Augmented Machine Learning Using Autoencoder for Semiconductor Variation Identification and Inverse Design.
Kashyap MehtaSophia Susan RajuMing XiaoBoyan WangYuhao ZhangWong Hiu YungPublished in: IEEE Access (2020)
Keyphrases
- machine learning
- data sets
- pattern recognition
- computer vision
- decision trees
- relational databases
- active learning
- natural language processing
- software development
- inductive learning
- design process
- design parameters
- computer aided design
- design decisions
- engineering design
- learning systems
- building blocks
- knowledge acquisition
- text mining
- expert systems
- case study
- web services