Some New Error Bounds and Approximations for Pattern Recognition.
John T. ChuPublished in: IEEE Trans. Computers (1974)
Keyphrases
- error bounds
- pattern recognition
- theoretical analysis
- worst case
- computer vision
- image analysis
- signal processing
- image processing
- machine learning
- neural network
- pattern recognition problems
- feature extraction
- approximation methods
- dimensionality reduction
- pattern analysis
- pattern classification
- graph matching
- wavelet synopses
- rough sets
- upper bound
- computational complexity
- query answers