Classification and optimization of potentially runaway processes using topology tools.
Sabrina CopelliMarco DerudiCarlo Sala CattaneoGiuseppe NanoVincenzo TorrettaRenato RotaPublished in: Comput. Chem. Eng. (2013)
Keyphrases
- pattern recognition
- image classification
- text classification
- classification accuracy
- pattern classification
- support vector machine svm
- classification systems
- classification scheme
- classification algorithm
- supervised learning
- feature space
- support vector
- support vector machine
- preprocessing
- optimization algorithm
- svm classifier
- feature extraction
- classification rate
- classification rules
- machine learning
- global optimization
- decision trees
- automatic classification
- data mining
- feature vectors
- cost sensitive
- optimization method
- classification method
- training data