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Test Pattern Generator for Majority Voter based QCA Combinational Circuits targeting MMC Defect.

Vaishali DhareUsha Mehta
Published in: ETS (2019)
Keyphrases
  • pattern generator
  • cellular automata
  • cmos technology
  • asynchronous circuits
  • logic circuits
  • data sets
  • neural network
  • multi class
  • special case
  • multi modal
  • test data
  • voting scheme
  • power dissipation