Login / Signup
The I Test: An Improved Dependence Test for Automatic Parallelization and Vectorization.
Xiangyun Kong
David Klappholz
Kleanthis Psarris
Published in:
IEEE Trans. Parallel Distributed Syst. (1991)
Keyphrases
</>
neural network
artificial intelligence
image sequences
machine learning
multimedia
multiscale
search algorithm
artificial neural networks
test cases
semi automatic
parallel processing