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A 0.65-V, 500-MHz Integrated Dynamic and Static RAM for Error Tolerant Applications.

Amit KazimirskyAdam TemanNoa EdriAlexander Fish
Published in: IEEE Trans. Very Large Scale Integr. Syst. (2017)
Keyphrases
  • error tolerant
  • graph matching
  • object recognition
  • neural network
  • computer vision
  • pattern recognition
  • subgraph isomorphism