Bug Classification: Feature Extraction and Comparison of Event Model using Naïve Bayes Approach
Sunil Joy DommatiRuchi AgrawalRam Mohana Reddy GuddetiS. Sowmya KamathPublished in: CoRR (2013)
Keyphrases
- feature extraction
- probabilistic model
- feature vectors
- support vector
- pattern recognition
- classification algorithm
- machine learning
- pattern classification
- classification method
- text classification
- objective function
- image classification
- classification accuracy
- support vector machine
- supervised classification
- feature set
- wavelet transform
- multi class
- preprocessing
- training data
- face recognition
- high level
- feature selection
- learning algorithm