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Machine Learning Methods for Abnormality Detection in Hard Disk Drive Assembly Process: Bi-LSTM, Wavelet-CNN and SVM.
Masayuti Simongyi
Prabhas Chongstitvatana
Published in:
EECS (2018)
Keyphrases
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abnormality detection
hard disk drive
assembly process
solid state
training set
knn
design process
printed circuit boards
left ventricular
multiresolution
failure rate
data structure
probability distribution
model construction