Login / Signup

Testability analysis and insertion for RTL circuits based on pseudorandom BIST.

Joan CarlettaChristos A. Papachristou
Published in: ICCD (1995)
Keyphrases
  • database
  • real time
  • neural network
  • data analysis
  • pseudorandom
  • artificial intelligence
  • high speed
  • lightweight
  • quantitative analysis
  • delay insensitive