Generalized test automation method for MOSFET's including characteristics measurements and model parameters extraction for aero-space applications.
Konstantin O. PetrosyantsLev M. SamburskyIgor A. KharitonovMamed R. Ismail-ZadePublished in: EWDTS (2017)
Keyphrases
- probabilistic model
- detection method
- significant improvement
- support vector machine svm
- experimental evaluation
- optimization method
- clustering method
- high accuracy
- statistical significance
- test data
- optimization algorithm
- theoretical analysis
- support vector machine
- computational cost
- dynamic programming
- pairwise
- training data
- low dimensional
- computational complexity
- objective function
- segmentation method
- classification method
- multiscale
- similarity measure