Modeling MOS Snapback for Circuit-Level ESD Simulation Using BSIM3 and VBIC Models.
Yuanzhong (Paul) ZhouDuane ConnerneyRonald CarrollTimwah LukPublished in: ISQED (2005)
Keyphrases
- simulation models
- modeling framework
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- mathematical models
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- neural network
- physical models
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- formal models
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- parameter estimation
- high speed
- probabilistic model
- real time
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- stochastic models
- genetic algorithm