Testing Carry Logic Modules of SRAM-based FPGAs.
Xiaoling SunJian XuPieter M. TrouborstPublished in: MTDT (2001)
Keyphrases
- random access memory
- multi valued
- logic programming
- data transmission
- field programmable gate array
- software testing
- automated reasoning
- design considerations
- modular structure
- proof theory
- linear logic
- asynchronous circuits
- digital circuits
- functional modules
- defeasible logic
- classical logic
- logical framework
- real time
- probability theory
- low power
- neural network